q=%E5%B9%B6%E5%88%97%E9%A2%98%E5%90%8D%EF%BC%9Acharacterization+methods+for+radiation+induced+defects+in+semiconductor+materials+and+devices&searchType=standard&isFacet=true&view=standard&rows=10&sortWay=score&sortOrder=desc&curlibcode=PY&searchWay0=marc&logical0=AND
rows=10&curlibcode=PY&searchWay0=marc&logical0=AND
并列题名：Characterization methods for radiation induced defects in semiconductor materials and devices